Keywords: Advanced Imaging Techniques SEM-EDS IR Microscopy FlatQUAD Nanotechnology Additive Tracing Material Characterization Instrumentation Developments Data Analysis AI in Material Science Environmental Analysis Coatings Technology Corrosion Imaging UV Curing Battery Technology
| Speakers | Ville Saarimaa, Top Analytica Gaurav Mohanty, Tampere University Magnus Johnson, KTH Royal Institute of Technology in Stockholm Jyrki Juhanoja, Top Analytica Václav Šefl, University of Chemistry and Technology in Prague Petre-Flaviu Gostin, Technical University of Denmark, Chemical Engineering Jukka Kömi, University of Oulu Miriam Unger, Phototermal Spectroscopy Corp. Andrew King, Renishaw Michael Andersson, Xspect Solutions Evgenia Salin, Laura Kotomaa & Olav Eklund, Åbo Akademi Jussi Jääskeläinen, Nokia Laura Tiainen, Eurofins Prerna Sudera, Thermo Fisher Scientific Daria Jardas Babić, University of Rijeka, Faculty of Physics & Centre for Micro- and Nanosciences and Technologies Sven Kayser, IONTOF Sten Sturefelt, Spectral Juusto Nästi, Blue Scientific Alexander Klasen, Park Systems Europe Markus Virtanen, Top Analytica Teemu Paunikallio, Top Analytica |
Exhibitors
