{
  "company": {
    "name": {
      "fi": "Top Analytica Oy Ab",
      "en": "Top Analytica Ltd"
    },
    "type": {
      "fi": "Materiaalianalyysi ja laboratoriopalvelut",
      "en": "Materials analysis and analytical laboratory services"
    },
    "website": "https://topanalytica.com",
    "contact_model": "request_quote"
  },

  "services": [
    {
      "id": "ASBESTOS-001",
      "title": {
        "fi": "Asbestianalyysi",
        "en": "Asbestos Analysis"
      },
      "description": {
        "fi": "Asbestikuitujen tunnistus materiaaleista, pölystä ja ilmanäytteistä SEM-EDS ja PLM -menetelmillä. Nopea ja puolueeton raportointi.",
        "en": "Detection of asbestos fibers in materials, dust, and air samples using SEM-EDS and PLM. Fast and impartial reporting."
      },
      "category": "Safety Testing",
      "sub_category": "Asbestos Testing",
      "methods": ["SEM-EDS", "PLM"],
      "sample_types": ["bulk material", "dust", "air filter"],
      "turnaround_time": "1–3 days",
      "audience": {
        "fi": "Rakennusala, yksityishenkilöt",
        "en": "Construction industry, private households"
      },
      "url": "https://www.topanalytica.com/asbesti-ja-haitta-ainetutkimukset/asbestitutkimus",
      "keywords": ["asbestos", "SEM", "PLM", "hazardous materials"]
    },

    {
      "id": "SEM-EDS-001",
      "title": {
        "fi": "Elektronimikroskopia (SEM-EDS / WDS / EBSD)",
        "en": "Electron Microscopy (SEM-EDS / WDS / EBSD)"
      },
      "description": {
        "fi": "Korkean resoluution mikroskopia alkuaine-, pintarakenteen ja kiderakenteen analyysiin.",
        "en": "High-resolution microscopy for elemental, surface, and crystal structure analysis."
      },
      "category": "Material Characterization",
      "methods": ["SEM", "EDS", "WDS", "EBSD"],
      "keywords": ["electron microscopy", "materials analysis", "SEM-EDS"]
    },

    {
      "id": "FTIR-RAMAN-001",
      "title": {
        "fi": "FTIR / Raman-spektroskopia",
        "en": "FTIR / Raman Spectroscopy"
      },
      "description": {
        "fi": "Molekyylirakenteen ja kemiallisen koostumuksen tunnistus orgaanisille ja epäorgaanisille materiaaleille.",
        "en": "Molecular and chemical structure identification for organic and inorganic materials."
      },
      "category": "Spectroscopy",
      "methods": ["FTIR", "Raman"],
      "keywords": ["spectroscopy", "molecular analysis"]
    },

    {
      "id": "TOF-SIMS-001",
      "title": {
        "fi": "TOF-SIMS pintamassaspektrometria",
        "en": "TOF-SIMS Surface Mass Spectrometry"
      },
      "description": {
        "fi": "Erittäin herkkä pinta-analyysi alkuaineille, molekyyleille ja kontaminaatioille.",
        "en": "Ultra-sensitive surface analysis for elements, molecules, and contamination."
      },
      "category": "Surface Analysis",
      "methods": ["TOF-SIMS"],
      "keywords": ["surface chemistry", "contamination", "mass spectrometry"]
    },

    {
      "id": "XPS-001",
      "title": {
        "fi": "XPS / ESCA pintakemia",
        "en": "XPS / ESCA Surface Chemistry"
      },
      "description": {
        "fi": "Pintojen kemiallinen koostumus ja sidostilat nanometriskaalassa.",
        "en": "Surface chemical composition and bonding states at nanoscale."
      },
      "category": "Surface Analysis",
      "methods": ["XPS"],
      "keywords": ["surface analysis", "chemical state"]
    },

    {
      "id": "XRF-001",
      "title": {
        "fi": "XRF alkuaineanalyysi",
        "en": "XRF Elemental Analysis"
      },
      "description": {
        "fi": "Nopea ja ei-tuhoava alkuainekoostumuksen analyysi materiaaleille.",
        "en": "Fast non-destructive elemental composition analysis."
      },
      "category": "Material Characterization",
      "methods": ["XRF"],
      "keywords": ["elemental analysis", "metals", "minerals"]
    },

    {
      "id": "CA-001",
      "title": {
        "fi": "Kontaktikulma ja pintajännitys",
        "en": "Contact Angle and Surface Energy"
      },
      "description": {
        "fi": "Pintojen kastuvuuden ja pinnoiteominaisuuksien analyysi.",
        "en": "Analysis of wettability and coating performance."
      },
      "category": "Surface Analysis",
      "methods": ["Contact Angle"],
      "keywords": ["surface energy", "adhesion", "coatings"]
    },

    {
      "id": "FAILURE-001",
      "title": {
        "fi": "Vaurio- ja vikaanalyysi",
        "en": "Failure Analysis"
      },
      "description": {
        "fi": "Materiaalivaurioiden juurisyyn selvitys teollisuudelle ja R&D:lle.",
        "en": "Root cause analysis of material failures for industry and R&D."
      },
      "category": "Engineering Analysis",
      "methods": ["SEM", "Microscopy", "Chemical Analysis"],
      "keywords": ["failure analysis", "fracture", "corrosion"]
    },

    {
      "id": "LM-001",
      "title": {
        "fi": "Optinen mikroskopia (LM / PLM)",
        "en": "Optical Microscopy (LM / PLM)"
      },
      "description": {
        "fi": "Kuitu-, rakenne- ja asbestianalyysi optisella mikroskopialla.",
        "en": "Fiber, structure, and asbestos analysis using optical microscopy."
      },
      "category": "Material Characterization",
      "methods": ["LM", "PLM"],
      "keywords": ["optical microscopy", "fiber analysis"]
    },

    {
      "id": "SAMPLE-PREP-001",
      "title": {
        "fi": "Näytteenvalmistus",
        "en": "Sample Preparation"
      },
      "description": {
        "fi": "Mikrotomi, ionisuihkuleikkaus, kemiallinen käsittely ja dispersio analyysinäytteille.",
        "en": "Microtome, ion beam, chemical treatment, and dispersion for analytical samples."
      },
      "category": "Sample Handling",
      "methods": ["Microtome", "FIB", "Chemical Prep"],
      "keywords": ["sample prep", "microscopy preparation"]
    },

    {
      "id": "BUNDLE-ASBESTOS-001",
      "title": {
        "fi": "Asbestitutkimuspaketti",
        "en": "Complete Asbestos Package"
      },
      "description": {
        "fi": "Näytteenotosta raporttiin asti kattava asbestianalyysi.",
        "en": "Full asbestos analysis workflow from sampling to reporting."
      },
      "category": "Safety Testing",
      "bundle": true
    },

    {
      "id": "BUNDLE-MATERIAL-001",
      "title": {
        "fi": "Materiaalianalyysin kokonaispaketti",
        "en": "Material Characterization Workflow"
      },
      "description": {
        "fi": "SEM, FTIR, XPS, XRF ja näytteenvalmistus yhdistettynä.",
        "en": "Combined SEM, FTIR, XPS, XRF and sample preparation workflow."
      },
      "category": "Material Characterization",
      "bundle": true
    }
  ],

  "metadata": {
    "version": "3.0",
    "generated": "2026-04-27",
    "purpose": "AI visibility, GEO optimization, structured service discovery",
    "note": "FI+EN bilingual atomic service schema optimized for LLM retrieval"
  }
}